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Patent Searching and Data


Title:
SAMPLE INSPECTION DEVICE AND SAMPLE INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2021/220988
Kind Code:
A1
Abstract:
A sample inspection device (10A) according to an embodiment includes an inspection unit (343), an input/output unit (40), a communication unit (342), and a control unit (341). The inspection unit detects a detection target included in a sample. The input/output unit includes a display unit (411) that displays information related to the inspection, and an input unit (42) that receives an input of the information related to the inspection. The communication unit carries out communication with slave sample inspection devices (10B, 10C) that include the inspection unit. The control unit causes control information used in control of the slave sample inspection devices to be sent from the communication unit and also processes detection results received from the slave sample inspection devices.

Inventors:
NAWATA ISAO (JP)
HARAGASHIRA MOTOJI (JP)
Application Number:
PCT/JP2021/016533
Publication Date:
November 04, 2021
Filing Date:
April 23, 2021
Export Citation:
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Assignee:
CANON MEDICAL SYSTEMS CORP (JP)
International Classes:
G01N35/00
Foreign References:
JP2016050934A2016-04-11
JP2008039556A2008-02-21
JP2012233710A2012-11-29
JP2012093326A2012-05-17
JP2010195111A2010-09-09
JP2018069768A2018-05-10
Attorney, Agent or Firm:
TORANOMON INTELLECTUAL PROPERTY FIRM (JP)
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