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Patent Searching and Data


Title:
SAMPLE OBSERVATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/198283
Kind Code:
A1
Abstract:
A sample observation device 1 comprises: an illumination optical system 3 for shining a sheet of light L2 on a sample S; a sweeping unit 4 for sweeping the sample S in one direction so as to pass through the illumination plane R of the sheet of light L2; an imaging optical system 5 which has an observation axis P2 inclined relative to the illumination plane R and images observation light L3 generated by the sample S due to illumination by the sheet of light L2; an image acquisition unit 6 for acquiring image data 31 corresponding to the optical image of the observation light L3 imaged by the imaging optical system 5; and an image generation unit 8 for generating observation image data 32 of the sample S on the basis of the image data 31 acquired by the image acquisition unit 6. The imaging optical system 5 includes a non-axisymmetric optical element that bends light beams L3a of the observation light L3 in one axis and does not bend light beams L3b in another axis orthogonal to the one axis.

Inventors:
KOBAYASHI Masanori (1126-1 Ichino-cho, Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
YAMAMOTO Satoshi (1126-1 Ichino-cho, Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
Application Number:
JP2019/000520
Publication Date:
October 17, 2019
Filing Date:
January 10, 2019
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS K.K. (1126-1, Ichino-cho Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
International Classes:
G02B21/00; G02B3/06; G02B5/04; G02B21/06; G02B21/36
Foreign References:
JP2017501429A2017-01-12
JP2016537670A2016-12-01
JP2017513063A2017-05-25
JP2016525228A2016-08-22
JP2016537671A2016-12-01
JP2016525229A2016-08-22
JP2014202967A2014-10-27
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (SOEI PATENT AND LAW FIRM, Marunouchi MY PLAZA 9th fl. 1-1, Marunouchi 2-chome, Chiyoda-k, Tokyo 05, 〒1000005, JP)
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