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Title:
SAMPLE RACK FOR HEATING TEMPERATURE ADJUSTMENT AND SAMPLE TEMPERATURE ADJUSTMENT DEVICE USING SAID SAMPLE RACK FOR HEATING TEMPERATURE ADJUSTMENT
Document Type and Number:
WIPO Patent Application WO/2015/162680
Kind Code:
A1
Abstract:
A sample rack for heating temperature adjustment is provided with a lower holder that is configured from a heat insulating material and is provided with recesses that accommodate the bottoms of sample containers inserted from the bottom surface sides thereof and an upper holder that is configured from a heat insulating material, has an upper side holding surface for covering the parts of the outer surfaces of the sample containers held in the lower holder that are above the parts accommodated in the lower holder and a lower end part in contact with a heat-transfer surface of a sample temperature adjustment device on which the sample rack is placed, and transfers the heat from the heat-transfer surface to the parts of the sample containers above the parts accommodated in the recesses via the lower end part and upper side holding surface.

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Inventors:
YASUNAGA KENICHI (JP)
Application Number:
PCT/JP2014/061215
Publication Date:
October 29, 2015
Filing Date:
April 22, 2014
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N1/28; G01N30/18; G01N35/00
Foreign References:
JP2000137031A2000-05-16
JP2007017403A2007-01-25
JP2005265807A2005-09-29
JP2013205090A2013-10-07
JP2011099705A2011-05-19
Attorney, Agent or Firm:
NOGUCHI SHIGEO (JP)
Shigeo Noguchi (JP)
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