Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
Document Type and Number:
WIPO Patent Application WO/2019/155836
Kind Code:
A1
Abstract:
This sample support (1) is for ionization of a sample. The sample support is provided with a substrate (2) having a mutually opposite first surface (2a) and second surface (2b), and a conduction layer (4) provided at least on the first surface. In an effective region of the substrate for ionizing a component of the sample, multiple through-holes (20) are formed that open to the first surface and the second surface, and in each of the multiple through-holes, the width of first openings on the first surface side is greater than the width of second openings on the second surface side.

Inventors:
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
Application Number:
PCT/JP2019/001115
Publication Date:
August 15, 2019
Filing Date:
January 16, 2019
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01N27/62; G01N27/64; H01J49/04; H01J49/16
Domestic Patent References:
WO2017038709A12017-03-09
Foreign References:
JP2009080106A2009-04-16
JP3122331U2006-06-08
JP2007309860A2007-11-29
US20080179513A12008-07-31
JP6093492B12017-03-08
Other References:
See also references of EP 3751272A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Download PDF: