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Title:
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
Document Type and Number:
WIPO Patent Application WO/2021/176857
Kind Code:
A1
Abstract:
A sample support used for ionization of sample components, the sample support comprising: a substrate having a first surface, a second surface opposite to the first surface, and a plurality of through holes that open to the first surface and the second surface; a conductive layer provided at least on the first surface; and an cationization agent that is provided to the plurality of through holes and is for cationizing the components by using prescribed atoms.

Inventors:
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
TASHIRO AKIRA (JP)
Application Number:
PCT/JP2021/001314
Publication Date:
September 10, 2021
Filing Date:
January 15, 2021
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01N1/28; G01N27/62; H01J49/04
Domestic Patent References:
WO2015116627A12015-08-06
WO2020026629A12020-02-06
WO2019058857A12019-03-28
WO2019155967A12019-08-15
WO2019155836A12019-08-15
Foreign References:
JP2009504161A2009-02-05
JP2004510996A2004-04-08
JP2014021048A2014-02-03
JP2004354376A2004-12-16
JP6093492B12017-03-08
JP6093492B12017-03-08
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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