Title:
SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
Document Type and Number:
WIPO Patent Application WO/2022/130764
Kind Code:
A1
Abstract:
This sample support is equipped with a substrate, and a porous layer provided on the substrate and having a surface on the reverse side thereof from the substrate. The porous layer includes a main layer having a plurality of holes that open to said surface. Each of the plurality of holes includes an extending part that extends in the thickness direction of the substrate, and an opening part that widens toward said surface from the surface-side end of the extending part. The average depth of the plurality of holes is 3-100 μm inclusive. The value obtained by dividing the average depth by the average width of the plurality of holes is 9-2,500 inclusive.
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Inventors:
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
TASHIRO AKIRA (JP)
OHMURA TAKAYUKI (JP)
TASHIRO AKIRA (JP)
Application Number:
PCT/JP2021/038075
Publication Date:
June 23, 2022
Filing Date:
October 14, 2021
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01N27/62; H01J49/00; H01J49/04; H01J49/16; H01J49/40
Domestic Patent References:
| WO2019155835A1 | 2019-08-15 |
Foreign References:
| JP2010175338A | 2010-08-12 | |||
| JP6093492B1 | 2017-03-08 | |||
| JP4885142B2 | 2012-02-29 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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