Title:
SAMPLE SUPPORT
Document Type and Number:
WIPO Patent Application WO/2021/100271
Kind Code:
A1
Abstract:
Provided is a sample support used in ionization of samples. The sample support (1A) comprises: a substrate (2) that has a first surface, a second surface on the opposite side to the first surface, and a measurement region (R1) having formed therein a plurality of through-holes that open to the first surface and the second surface; a frame (3) provided upon the first surface of the substrate and formed so as to surround the measurement region when viewed from the thickness direction of the substrate; and a marker (6) provided upon an outer surface of the frame on the opposite side to the substrate.
Inventors:
TASHIRO AKIRA (JP)
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
KOTANI MASAHIRO (JP)
OHMURA TAKAYUKI (JP)
Application Number:
PCT/JP2020/031455
Publication Date:
May 27, 2021
Filing Date:
August 20, 2020
Export Citation:
Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
G01N27/62; H01J49/04
Domestic Patent References:
| WO2019058783A1 | 2019-03-28 | |||
| WO2007020862A1 | 2007-02-22 | |||
| WO2002084577A1 | 2002-10-24 |
Foreign References:
| JP2015179630A | 2015-10-08 | |||
| JP2007171003A | 2007-07-05 | |||
| JP3122331U | 2006-06-08 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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