Title:
SCAN BASED TEST DESIGN IN SERDES APPLICATIONS
Document Type and Number:
WIPO Patent Application WO/2017/197638
Kind Code:
A1
Abstract:
A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed scan test data for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed scan test data, and providing a corresponding portion of the demultiplexed scan test data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning the scan chain based on the corresponding portion of the demultiplexed scan test data, to produce output test data.
Inventors:
QIAN HAOLI (US)
DAI YIFEI (CN)
SUN RUIQING (CN)
DAI YIFEI (CN)
SUN RUIQING (CN)
Application Number:
PCT/CN2016/082796
Publication Date:
November 23, 2017
Filing Date:
May 20, 2016
Export Citation:
Assignee:
CREDO TECH GROUP LTD (KY)
International Classes:
G01R31/28
Foreign References:
| US20040049723A1 | 2004-03-11 | |||
| CN103033741A | 2013-04-10 | |||
| CN1591035A | 2005-03-09 | |||
| CN101855562A | 2010-10-06 | |||
| US20020061606A1 | 2002-05-23 |
Attorney, Agent or Firm:
SHANGHAI PATENT & TRADEMARK LAW OFFICE, LLC (CN)
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