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Patent Searching and Data


Title:
SCANNING ANTENNA, METHOD FOR INSPECTING SCANNING ANTENNA, AND METHOD FOR MANUFACTURING SCANNING ANTENNA
Document Type and Number:
WIPO Patent Application WO/2017/170133
Kind Code:
A1
Abstract:
The present invention is provided with: a TFT substrate (106) which has a transmission/reception region (R1) having an array of a plurality of antenna units and a non-transmission/reception region (R2) and which includes a plurality of patch electrodes and a plurality of first TFTs supported by a first dielectric substrate; a slot substrate including a slot electrode having a plurality of slots; a liquid-crystal layer provided between the TFT substrate and the slot substrate; and a plurality of inspection electrode parts RE disposed so as not to overlap the plurality of antenna units when viewed in the normal direction of the first dielectric substrate. Each of the plurality of inspection electrode parts (RE) includes: a second TFT (120) which is supported by the TFT substrate (106) and which has a source electrode connected to a source bus line and a gate electrode connected to a gate bus line; a transparent electrode (130) which is supported by the TFT substrate (106) and which is connected to a drain electrode of the second TFT (120); and a slot electrode extended so as to oppose the liquid-crystal layer via the transparent electrode.

Inventors:
INUKAI JUNICHI
HARA TAKESHI
YASUO FUMITOSHI
KOSAKA TOMOHIRO
KADONO SHINYA
Application Number:
PCT/JP2017/011753
Publication Date:
October 05, 2017
Filing Date:
March 23, 2017
Export Citation:
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Assignee:
SHARP KK (JP)
International Classes:
H01Q3/34; G01R29/10; H01Q3/44; H01Q13/22; H01Q21/06
Foreign References:
JP2004005516A2004-01-08
JP2005277406A2005-10-06
JPH04234202A1992-08-21
JP2009538565A2009-11-05
JP2000022428A2000-01-21
Attorney, Agent or Firm:
OKUDA Seiji (JP)
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