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Patent Searching and Data


Title:
SCANNING CON−FOCAL MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2003/038503
Kind Code:
A1
Abstract:
A scanning con−focal microscope for obtaining an observation image of a sample while changing the focal surface on the sample in the optical axis direction and constituting a three−dimensional image or an image of a large focal depth of the sample. The microscope includes a selection unit (33) for selecting a luminance signal of optimal wavelength band from a plurality of luminance signals having different wavelength bands which are output after photoelectrical conversion of the light from the sample by an image pickup unit and an image constituting unit (32) for using the luminance signal of the optimal wavelength band to constitute a three−dimensional image or an image of a large focal depth of the sample.

Inventors:
NISHIYAMA YASUO (JP)
HARAGUCHI TADASHI (JP)
KANEGAE SHIGERU (JP)
Application Number:
PCT/JP2002/011204
Publication Date:
May 08, 2003
Filing Date:
October 29, 2002
Export Citation:
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Assignee:
OLYMPUS OPTICAL CO (JP)
NISHIYAMA YASUO (JP)
HARAGUCHI TADASHI (JP)
KANEGAE SHIGERU (JP)
International Classes:
G02B21/00; (IPC1-7): G02B21/00; G02B21/36
Foreign References:
JPH1184264A1999-03-26
JP2001056438A2001-02-27
JPH11174332A1999-07-02
Attorney, Agent or Firm:
Osuga, Yoshiyuki (Nibancho Bldg. 8-20, Nibanch, Chiyoda-ku Tokyo, JP)
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