Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SCANNING TYPE TUNNEL MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/1989/001603
Kind Code:
A1
Abstract:
A scanning type tunnel microscope comprises a combination of an optical microscope with a tunnel scanning unit. The tunnel scanning unit is equipped with a probe held with a predetermined spacing from a sample placed on a sample mount in an axial direction and an actuator which moves the sample mount and the probe in the axial direction to bring them close to a tunnel region, and drives them relatively and three-dimensionally. An objective lens and the probe are disposed in such a manner that the center axis of the probe of the scanning tunnel unit is in agreement with the optical axis of the objective lens of the optical microscope. STM observation of the surface of the sample is made by moving the sample and the probe in the axial direction to bring them into the tunnel region and effecting scanning in the surface direction while moving them little by little in the axial direction in such a manner as to keep a tunnel current constant. Focusing is made by moving the objective lens of the optical microscope in the axial direction and a field of vision on the STM observation surface is observed as an optical microscope image through an eyepiece.

Inventors:
SATO CHIAKI (JP)
KOSHIISHI KIYOZO (JP)
SHIGETOMI SADAO (JP)
MISHIMA SHUZO (JP)
TAKASE TSUGIKO (JP)
Application Number:
PCT/JP1988/000804
Publication Date:
February 23, 1989
Filing Date:
August 12, 1988
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
OLYMPUS OPTICAL CO (JP)
International Classes:
A61K31/41; A61K31/433; A61K31/535; A61P25/02; A61P27/02; C07D285/10; C07D417/00; C07D417/12; G01B7/34; G01B21/30; G01N27/00; G01N37/00; G01Q30/02; G01Q60/10; G01Q60/16; G02B21/00; H01L41/09; (IPC1-7): G01B7/34; G01N23/00; H01J37/28
Foreign References:
US4343993A1982-08-10
JP5910687Y
Other References:
See also references of EP 0406413A4
Download PDF: