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Patent Searching and Data


Title:
SCENE ANALYSIS METHOD AND SYSTEM, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/099473
Kind Code:
A1
Abstract:
Disclosed are a scene analysis method and system, and an electronic device. The scene analysis method comprises: carrying out a convolution operation on an image to be analysed by using a deep neural network to obtain a first feature map (102); carrying out a pooling operation on the first feature map to obtain at least one second feature map (104); and according to the first feature map and the at least one second feature map, carrying out scene analysis on the image to obtain a scene analysis result of the image (106). The method is conducive to improving the accuracy of a scene analysis result.

Inventors:
SHI JIANPING (CN)
ZHAO HENGSHUANG (CN)
Application Number:
PCT/CN2017/114254
Publication Date:
June 07, 2018
Filing Date:
December 01, 2017
Export Citation:
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Assignee:
BEIJING SENSETIME TECH DEVELOPMENT CO LTD (CN)
International Classes:
G06V10/82; G06V20/10
Foreign References:
CN104933420A2015-09-23
CN105868785A2016-08-17
CN105701507A2016-06-22
CN106156807A2016-11-23
US20150104102A12015-04-16
Attorney, Agent or Firm:
BEIJING SIYUANZHIHUI INTELLECTUAL PROPERTY AGENCY (CN)
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