SCHEDULING FOR POWER AMPLIFIER CHARACTERIZATION AND MAXIMUM PERMISSIBLE EXPOSURE MEASUREMENT

WIPO Patent Application WO/2019/140442

A1

Certain aspects of the present disclosure provide systems and methods for performing a power amplifier characterization. One example method generally includes determining, by a user equipment, if a condition associated with a power amplifier characterization is met. In certain aspects, the method includes determining, by the user equipment, a calibration gap after the condition is met. The method also includes performing, by the user equipment, the power amplifier characterization of the one or more power amplifiers of the user equipment during the calibration gap.

DUNWORTH JEREMY DARREN (US)
VINTOLA TIMO VILLE (US)
CARBONE NICHOLAS MICHAEL (US)
BASSAM SEYED AIDIN (US)
APARIN VLADIMIR (US)
FERNANDO UDARA (US)

PCT/US2019/013649

July 18, 2019

January 15, 2019

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QUALCOMM INC (US)

H04B17/13

WO2008142150A1

2008-11-27

INTEL CORPORATION: "PA calibration gap for FR2", vol. RAN WG4, no. Reno, USA; 20171127 - 20171201, 17 November 2017 (2017-11-17), XP051375231, Retrieved from the Internet [retrieved on 20171117]
INTEL CORPORATION: "On uplink calibration signal", vol. RAN WG1, no. Nagoya, Japan; 20170918 - 20170921, 17 September 2017 (2017-09-17), XP051339747, Retrieved from the Internet [retrieved on 20170917]

GARG, Ankur et al. (US)

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