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Patent Searching and Data

Document Type and Number:
WIPO Patent Application WO/2017/115638
Kind Code:
This scintillator 1A is provided with: a supporting substrate 10; a light emitting layer 14 that is formed, on the substrate 10, from ZnO to which an impurity is added so that the electron concentration in the light emitting layer is from 2 × 1019 cm-3 to 2 × 1020 cm-3 (inclusive), and generates scintillation light in accordance with radiation incidence; a protective layer 16 that is formed, on the light emitting layer 14, from a material having a wider band gap than ZnO; and a metal layer 18 that is formed on the protective layer 16. The supporting substrate 10 is formed from a material that transmits the scintillation light generated by the light emitting layer 14. In addition, the metal layer 18 serves as a reflective layer that reflects the scintillation light from the light emitting layer 14. Consequently, the present invention enables the achievement of: a scintillator which is suitable for detection of radiation of electrons and the like; and an electron detector which uses this scintillator.

FUJITA Yasuhisa (1060 Nishikawatsu-cho, Matsue-sh, Shimane 04, 〒6908504, JP)
KONDO Minoru (1126-1 Ichino-cho, Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
Application Number:
Publication Date:
July 06, 2017
Filing Date:
December 09, 2016
Export Citation:
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NATIONAL UNIVERSITY CORPORATION SHIMANE UNIVERSITY (1060, Nishikawatsu-cho Matsue-sh, Shimane 04, 〒6908504, JP)
HAMAMATSU PHOTONICS K.K. (1126-1, Ichino-cho Higashi-ku, Hamamatsu-sh, Shizuoka 58, 〒4358558, JP)
International Classes:
G21K4/00; C09K11/00; C09K11/54; G01T1/20; H01J40/18
Foreign References:
Other References:
P. A. RODNYI ET AL.: "Optical and Luminescence Properties of Zinc Oxide", OPTICS AND SPECTROSCOPY, vol. 111, no. 5, 2011, pages 776 - 785, XP019986101
JOHN S. NEAL ET AL.: "Evaluation of Melt-Grown ZnO Single Crystals for Use as Alpha-Particle Detectors", IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 55, no. 3, June 2008 (2008-06-01), pages 1397 - 1403, XP011216711
ZHEHUI WANG ET AL.: "Thin scintillators for ultrafast hard X-ray imaging, Photon Counting Applications 2015", PROC. OF SPIE, vol. 9504, 6 May 2015 (2015-05-06), pages 95040N - 95040N-11, XP060053149
See also references of EP 3399527A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (SOEI PATENT AND LAW FIRM, Marunouchi MY PLAZA 9th fl. 1-1, Marunouchi 2-chome, Chiyoda-k, Tokyo 05, 〒1000005, JP)
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