Title:
SCINTILLATOR, MEASUREMENT APPARATUS, MASS SPECTROMETER, AND ELECTRON MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2021/131436
Kind Code:
A1
Abstract:
Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (6), a GaN layer (4) that is provided on the incident side to the sapphire substrate (6) and includes GaN, a quantum well structure (3) provided on the incident side to the GaN layer (4), and a conductive layer (2) provided on the incident side to the quantum well structure (3), wherein a plurality of emitting layers (21) including InGaN and a plurality of barrier layers (22) including GaN are alternatively stacked in the quantum well structure (3), and an oxygen-containing layer (23) including oxygen is provided between the quantum well structure (3) and the conductive layer (2).
Inventors:
IMAMURA SHIN (JP)
KUSUNOKI TOSHIAKI (JP)
TAKAHASHI ERI (JP)
SEKIGUCHI YOSHIFUMI (JP)
KANDA TAKAYUKI (JP)
KUSUNOKI TOSHIAKI (JP)
TAKAHASHI ERI (JP)
SEKIGUCHI YOSHIFUMI (JP)
KANDA TAKAYUKI (JP)
Application Number:
PCT/JP2020/043186
Publication Date:
July 01, 2021
Filing Date:
November 19, 2020
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
C09K11/00; C09K11/62; H01J37/244; H01J49/02
Foreign References:
| JP2017135039A | 2017-08-03 | |||
| JP2017157732A | 2017-09-07 | |||
| JP2005298603A | 2005-10-27 | |||
| US7910895B2 | 2011-03-22 | |||
| JP2019233378A | 2019-12-24 |
Attorney, Agent or Firm:
HIRAKI & ASSOCIATES (JP)
Download PDF:
Previous Patent: PROGRAM DEVELOPMENT ASSISTANCE SYSTEM AND PROGRAM DEVELOPMENT ASSISTANCE METHOD
Next Patent: REFRIGERANT CYCLE DEVICE
Next Patent: REFRIGERANT CYCLE DEVICE