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Patent Searching and Data


Title:
SCREEN SPECIFICATION ANALYSIS DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2016/051479
Kind Code:
A1
Abstract:
[Problem] To propose a screen specification analysis device and method capable of, when a current system is to be renewed, etc., facilitating the work required to identify the specifications of the current system and to create an estimate of the cost of renewing the system, as well as capable of improving the accuracy of the estimate of the cost. [Solution] A screen specification analysis device for analyzing the screen specifications of web screens provided by a server device, and a screen specification analysis method implemented by this screen specification analysis device, wherein: screen data of web screens are collected as screen logs while logs of operations performed on the web screens are collected as operation logs; a number of series of screen transitions are then extracted as scenarios on the basis of the collected operation logs; one or more feature quantities of each web screen are then calculated on the basis of the collected screen logs; similar scenarios are then integrated together on the basis of the calculated one or more feature quantities of each web screen; and screen specifications which indicate the screen transition specifications of each integrated scenario are then output.

Inventors:
KIKUCHI KATSURO (JP)
TASHIRO DAISUKE (JP)
EGI MASASHI (JP)
Application Number:
PCT/JP2014/075952
Publication Date:
April 07, 2016
Filing Date:
September 29, 2014
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G06F9/44; G06F11/34
Foreign References:
JP2010079342A2010-04-08
JP2010033456A2010-02-12
JPH1069381A1998-03-10
Other References:
AKIRA NISHIYAMA ET AL.: "WWW Access Logs Databases and its Utilization for Improving WWW Retrievals", IPSJ SIG NOTES, vol. 2001, no. 70, 18 July 2001 (2001-07-18), pages 193 - 200
Attorney, Agent or Firm:
OHGA, Shinji et al. (JP)
Heartly congratulation Shinji (JP)
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