Title:
SECONDARY BATTERY INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2015/011794
Kind Code:
A1
Abstract:
Provided is a secondary battery inspection method for quickly detecting, at the time of screening, the future occurrence of a micro-short-circuit, suppressing short-circuiting between positive and negative electrodes during aging, and promoting the rendering harmless of contaminants. The method comprises step (S12) for charging the aforementioned secondary battery, steps (S13, S14) for aging the secondary battery in a first pressed state, step (S17) for measuring the battery voltage (V1) after aging, step (S18) for screening the secondary battery in a second pressed state with a higher pressure than the first pressed state, and step (S19) for measuring the battery voltage (V2) after screening. Whether there is an internal short-circuit is determined (step (S20)) on the basis of the difference between the voltage (V1) measured in step (S17) and the voltage (V2) measured in step (S19).
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Inventors:
KURIHARA JUNKO (JP)
SAKAI KENICHI (JP)
IGA DAISUKE (JP)
AMEMIYA CHIKA (JP)
TANIZAKI HIROAKI (JP)
SAKAI KENICHI (JP)
IGA DAISUKE (JP)
AMEMIYA CHIKA (JP)
TANIZAKI HIROAKI (JP)
Application Number:
PCT/JP2013/069982
Publication Date:
January 29, 2015
Filing Date:
July 24, 2013
Export Citation:
Assignee:
AUTOMOTIVE ENERGY SUPPLY CORP (JP)
International Classes:
G01R31/36
Foreign References:
| JP2012003952A | 2012-01-05 | |||
| JP2010086754A | 2010-04-15 | |||
| JP2012104276A | 2012-05-31 | |||
| JP2010086754A | 2010-04-15 |
Other References:
See also references of EP 3026450A4
Attorney, Agent or Firm:
KOBAYASHI, Hiromichi et al. (JP)
Hiromichi Kobayashi (JP)
Hiromichi Kobayashi (JP)
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