Title:
SELF-DIAGNOSTIC CIRCUIT, AND SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/158347
Kind Code:
A1
Abstract:
A self-diagnostic circuit (BST1) diagnoses an abnormality detection circuit (20) having a first comparator (CMP1) to which a first reference voltage (Vref1) and a voltage based on an abnormality detection target voltage (Vo1) can be inputted. The self-diagnostic circuit has: a voltage switching unit (50) that switches the level of a voltage based on a second reference voltage (Vref2) and outputs same; a first path switching unit (51) that switches between the path on which the voltage outputted from the voltage switching unit is inputted to the first comparator, and the path on which the voltage based on the abnormality detection target voltage is inputted to the first comparator; and a control unit (15) that controls the voltage switching unit and the path switching unit.
Inventors:
SUMII RYOSUKE (JP)
OSHIKAWA KATSUHIRO (JP)
MATSUURA TAKAYUKI (JP)
OSHIKAWA KATSUHIRO (JP)
MATSUURA TAKAYUKI (JP)
Application Number:
PCT/JP2022/000689
Publication Date:
July 28, 2022
Filing Date:
January 12, 2022
Export Citation:
Assignee:
ROHM CO LTD (JP)
International Classes:
H02H7/20; G01R31/28
Foreign References:
| JP2017195654A | 2017-10-26 | |||
| JP2016220172A | 2016-12-22 | |||
| JP2009152129A | 2009-07-09 | |||
| JP2020187055A | 2020-11-19 | |||
| JP2020186969A | 2020-11-19 | |||
| JPH04130086U | 1992-11-30 | |||
| US20150070950A1 | 2015-03-12 | |||
| US20150323590A1 | 2015-11-12 |
Attorney, Agent or Firm:
SANO PATENT OFFICE (JP)
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