Title:
SELF-EXAMINATION METHOD AND SELF-EXAMINATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2012/033244
Kind Code:
A1
Abstract:
The present invention relates to a self-examination method and to a self-examination device. More specifically, the present invention relates to a self-examination method and self-examination device for providing examination guidance information for self examination.
More Like This:
| JP6404098 | Indoor accident avoidance system |
| JPS63113325 | HUMAN SKIN TEMPERATURE DETECTION PROBE |
| WO/2024/070753 | SKIN EVALUATION METHOD, SKIN EVALUATION DEVICE, AND PROGRAM |
Inventors:
CHOI KYUHYOUNG (KR)
Application Number:
PCT/KR2010/006122
Publication Date:
March 15, 2012
Filing Date:
September 09, 2010
Export Citation:
Assignee:
LG ELECTRONICS INC (KR)
CHOI KYUHYOUNG (KR)
CHOI KYUHYOUNG (KR)
International Classes:
A61B5/00; A61B5/16
Foreign References:
| JPH11347003A | 1999-12-21 | |||
| JPH0795961A | 1995-04-11 | |||
| JP2000197612A | 2000-07-18 | |||
| KR100361554B1 | 2002-11-22 |
Attorney, Agent or Firm:
ROYAL PATENT & LAW OFFICE (KR)
특허법인로얄 (KR)
특허법인로얄 (KR)
Download PDF:
Claims: