Title:
SELF-REFERENCING TERAHERTZ ELECTRO-OPTIC SAMPLING SPECTRAL INTERFEROMETER AND MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/214158
Kind Code:
A1
Abstract:
A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system.
The self-referencing terahertz electro-optic sampling spectral interferometer comprises a pulse stretcher (102), a broadband half-wave plate (103), lenses (106, 110), a terahertz electro-optic crystal (109), a birefringent crystal (111), a linear polarizer (112), and a spectrometer (113). The optical elements have a smart structural design related to self-referencing interference, and chirped pulses are employed, on the basis of electro-optic sampling and the spectral interference principle, as a probe to complete a single measurement of high-intensity terahertz time-domain spectroscopy.
Inventors:
XU SHIXIANG (CN)
ZHENG SHUIQIN (CN)
LIU JUNMIN (CN)
CAI YI (CN)
ZENG XUANKE (CN)
SHANGGUAN HUANGCHENG (CN)
ZHENG SHUIQIN (CN)
LIU JUNMIN (CN)
CAI YI (CN)
ZENG XUANKE (CN)
SHANGGUAN HUANGCHENG (CN)
Application Number:
PCT/CN2017/086137
Publication Date:
November 29, 2018
Filing Date:
May 26, 2017
Export Citation:
Assignee:
UNIV SHENZHEN (CN)
International Classes:
G01J3/45; G01J3/02
Foreign References:
| CN107014492A | 2017-08-04 | |||
| CN104913847A | 2015-09-16 | |||
| CN102004080A | 2011-04-06 | |||
| CN104749131A | 2015-07-01 | |||
| CN102175636A | 2011-09-07 | |||
| CN201540244U | 2010-08-04 | |||
| JP2004101510A | 2004-04-02 |
Attorney, Agent or Firm:
HENSEN INTELLECTUAL PROPERTY FIRM (CN)
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