Title:
SEMICONDUCTOR DEVICE INCLUDING TRANSPARENT ELECTRODE HAVING CONDUCTIVE FILAMENT FORMED THEREIN AND METHOD FOR MANUFACTURING SAME
Document Type and Number:
WIPO Patent Application WO/2017/014441
Kind Code:
A1
Abstract:
Disclosed are a semiconductor device that includes a transparent electrode having a conductive filament formed therein and a method for manufacturing the same. The present invention can form a conductive filament having a uniform density with a low voltage by allowing an electric field applied to a transparent electrode, which is an insulating material, to more efficiently spread into the entire area of a variable resistance material through a metal mesh by forming the metal mesh, which is formed of nano-scale metal, at the boundary of the transparent electrode formed of a low-conductive semiconductor layer and the variable resistance material. Furthermore, the nano metal mesh formed below the transparent electrode diffuses a current introduced through the transparent electrode into the whole semiconductor layer to enhance the current injection efficiency of the semiconductor device.
Inventors:
KIM TAE GEUN (KR)
LEE BYEONG RYONG (KR)
LEE BYEONG RYONG (KR)
Application Number:
PCT/KR2016/007056
Publication Date:
January 26, 2017
Filing Date:
June 30, 2016
Export Citation:
Assignee:
UNIV KOREA RES & BUS FOUND (KR)
International Classes:
H01L21/28; H01B5/14; H01B13/00
Foreign References:
KR20150083369A | 2015-07-17 | |||
KR100452751B1 | 2004-10-15 | |||
KR20090032366A | 2009-04-01 | |||
KR20100067503A | 2010-06-21 | |||
US20100148197A1 | 2010-06-17 |
Attorney, Agent or Firm:
B&IP-JOOWON PATENT AND LAW FIRM (KR)
Download PDF:
Previous Patent: ROBOT CLEANER
Next Patent: SCANNING ELECTRON MICROSCOPE CAPABLE OF OBTAINING OPTICAL IMAGE OF SAMPLE
Next Patent: SCANNING ELECTRON MICROSCOPE CAPABLE OF OBTAINING OPTICAL IMAGE OF SAMPLE