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Patent Searching and Data


Title:
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
Document Type and Number:
WIPO Patent Application WO/2018/074146
Kind Code:
A1
Abstract:
[Problem] To provide a structure which enables the use of a Zn alloy-based solder by an industrially simple technique, and which can maintain electro-mechanical bonding characteristics even after experiencing repeated large temperature changes. [Solution] A metal electrode 5d on a semiconductor chip 4 and a metal plate 1d are bonded using a Zn-Al-based alloy solder plate by implementing: a semiconductor chip bonding step in which, in order to avoid a corner portion of the semiconductor chip at which stress is concentrated in use, crushing and bonding, by ultrasonic bonding method, a metal oxide coating film 3d present on a surface of the solder plate only in a rectangular area with rounded corners; a metal plate bonding step in which the other main surface of the solder plate is opposed to the metal plate, and the metal oxide coating film is crushed and bonded in an intended area similarly by ultrasonic bonding method; and an alloy forming step in which the Zn-Al-based alloy is melted by heating, and a robust alloy area is formed in the first bonding area and the second bonding area, whereby a side surface is formed in a curved shape resistant to stress due to the presence of an oxide coating film.

Inventors:
TANISAWA HIDEKAZU (JP)
KATO FUMIKI (JP)
TAKAHASHI HIROKI (JP)
KOUI KENICHI (JP)
SATO HIROSHI (JP)
SATO SHINJI (JP)
MURAKAMI YOSHINORI (JP)
Application Number:
PCT/JP2017/034445
Publication Date:
April 26, 2018
Filing Date:
September 25, 2017
Export Citation:
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Assignee:
AIST (JP)
International Classes:
H01L21/52; B23K1/00; B23K1/06
Foreign References:
JP2009113050A2009-05-28
JP2016225552A2016-12-28
Attorney, Agent or Firm:
ITOH, Atsushi (JP)
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