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Title:
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/052434
Kind Code:
A1
Abstract:
Disclosed is a semiconductor device which is composed of an organic semiconductor that has excellent transistor characteristics. Specifically disclosed is a semiconductor device (1a) which comprises: a p-type organic transistor (P1) that comprises a gate electrode (12), a source electrode (14), a drain electrode (15) and a p-type organic semiconductor layer (16); and an n-type organic transistor (N1) that is electrically connected with the p-type organic transistor (P1) and comprises a gate electrode (22), a source electrode (24), a drain electrode (25) and an n-type organic semiconductor layer (26). First improving layers for accelerating the movement of electric charges are respectively provided between the source electrode (14) and the organic semiconductor layer (16) and between the drain electrode (25) and the organic semiconductor layer (26). Second improving layers for accelerating the movement of electric charges are respectively provided between the drain electrode (15) and the organic semiconductor layer (16) and between the source electrode (24) and the organic semiconductor layer (26), said second improving layers being formed from a material that is different from the material of the first improving layers. The source electrodes and the drain electrodes are formed from the same electrode material.

Inventors:
KAMURA, Masakazu (())
香村 勝一 (())
AOMORI, Shigeru (())
Application Number:
JP2010/068395
Publication Date:
May 05, 2011
Filing Date:
October 19, 2010
Export Citation:
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Assignee:
SHARP KABUSHIKI KAISHA (22-22, Nagaike-cho Abeno-ku, Osaka-sh, Osaka 22, 〒5458522, JP)
シャープ株式会社 (〒22 大阪府大阪市阿倍野区長池町22番22号 Osaka, 〒5458522, JP)
KAMURA, Masakazu (())
香村 勝一 (())
International Classes:
H01L29/786; H01L21/28; H01L21/8238; H01L27/08; H01L27/092; H01L51/05; H01L51/30
Foreign References:
JP2005294785A
JP2008311594A
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK (Daiwa Minamimorimachi Building, 2-6 Tenjinbashi 2-chome Kita, Kita-ku, Osaka-sh, Osaka 41, 〒5300041, JP)
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