Title:
SEMICONDUCTOR DEVICE, SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/079572
Kind Code:
A1
Abstract:
Provided is a semiconductor device that can measure a very small current. This semiconductor device has an operational amplifier, and a diode element, wherein a first terminal to which a current is inputted is electrically connected to an inversion input terminal of the operation amplifier and an input terminal of the diode element, and a second terminal from which a voltage is outputted is electrically connected to an output terminal of the operation amplifier and an output terminal of the diode element. A diode-connected transistor which has a metal oxide in a channel forming region is used for the diode element. An off-current of the transistor is extremely small, and thus a very small current can flow between the first and second terminals. Thus, the very small current flowing to the first terminal can be estimated from the voltage outputted from the second terminal.
Inventors:
SATO ERI (JP)
ONUKI TATSUYA (JP)
YAKUBO YUTO (JP)
KUNITAKE HITOSHI (JP)
ONUKI TATSUYA (JP)
YAKUBO YUTO (JP)
KUNITAKE HITOSHI (JP)
Application Number:
PCT/IB2019/058754
Publication Date:
April 23, 2020
Filing Date:
October 15, 2019
Export Citation:
Assignee:
SEMICONDUCTOR ENERGY LAB (JP)
International Classes:
G01R19/00; H01L21/822; H01L21/8234; H01L27/04; H01L27/06; H01L27/088; H01L29/786; H03F3/45; H03G11/02
Foreign References:
| JPH05347515A | 1993-12-27 | |||
| US4876534A | 1989-10-24 | |||
| JP2013040921A | 2013-02-28 | |||
| JPH0677298A | 1994-03-18 |
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