Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/093472
Kind Code:
A1
Abstract:
A protective diode (71) comprises a p-anode layer (21) and an n-cathode layer (22) which are alternately formed on a polysilicon layer, and comprises a pn-junction (74) which adopts a reverse blocking state when forward biased and every other one of which is short-circuited by a metal film (53). By connecting the protective diode (71) to a power semiconductor element (IGBT (72)), high breakdown resistance and reduced chip area can both be achieved at the same time, elevation of withstand voltage is suppressed even if a clamping voltage is repeatedly applied, and furthermore breakdown due to a negative surge voltage input to a gate terminal (G) can be prevented.
Inventors:
HARADA YUICHI (JP)
NAITO TATSUYA (JP)
TOYODA YOSHIAKI (JP)
NAITO TATSUYA (JP)
TOYODA YOSHIAKI (JP)
Application Number:
PCT/JP2011/051830
Publication Date:
August 04, 2011
Filing Date:
January 28, 2011
Export Citation:
Assignee:
FUJI ELECTRIC SYSTEMS CO LTD (JP)
HARADA YUICHI (JP)
NAITO TATSUYA (JP)
TOYODA YOSHIAKI (JP)
HARADA YUICHI (JP)
NAITO TATSUYA (JP)
TOYODA YOSHIAKI (JP)
International Classes:
H01L27/04; H01L21/822; H01L27/088; H01L29/739; H01L29/78; H01L29/786; H01L29/866
Foreign References:
JPH11251594A | 1999-09-17 | |||
JPH06163911A | 1994-06-10 | |||
JPH0750304A | 1995-02-21 | |||
JP2002538598A | 2002-11-12 | |||
JP2006019528A | 2006-01-19 | |||
JPH11284175A | 1999-10-15 | |||
JPH07202191A | 1995-08-04 | |||
JP2002141507A | 2002-05-17 | |||
JPS57141962A | 1982-09-02 | |||
JP2000174272A | 2000-06-23 | |||
US6770949B1 | 2004-08-03 | |||
JPH07130898A | 1995-05-19 | |||
JPH0472667A | 1992-03-06 | |||
JP2000077537A | 2000-03-14 | |||
JPH01259570A | 1989-10-17 | |||
JP2004327976A | 2004-11-18 | |||
JPH08316480A | 1996-11-29 |
Attorney, Agent or Firm:
SAKAI, AKINORI (JP)
Akinori Sakai (JP)
Akinori Sakai (JP)
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Claims:
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