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Title:
SEMICONDUCTOR DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/037828
Kind Code:
A1
Abstract:
Provided is a semiconductor device comprising an internal nonvolatile memory element and an input terminal (A) for receiving an external test control signal input and a input signal for writing/erasing voltage, wherein the semiconductor device is provided with: an output terminal (B) for the test control signal; a positive pulse detection circuit (3) for detecting that the test control signal is positive and outputting the test control signal to the test control signal output terminal when the test control signal is positive; and a negative pulse detection circuit (4) for detecting that the test control signal is negative and outputting the inverted test control signal to the test control signal output terminal when the test control signal is negative.

Inventors:
MOTOJIMA, Mutsuya (1-1 Showa-cho, Kariya-cit, Aichi 61, 〒4488661, JP)
Application Number:
JP2017/027286
Publication Date:
March 01, 2018
Filing Date:
July 27, 2017
Export Citation:
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Assignee:
DENSO CORPORATION (1-1 Showa-cho, Kariya-city Aichi, 61, 〒4488661, JP)
International Classes:
G11C29/14; G01R31/28; G01R31/3185; G06F11/22
Attorney, Agent or Firm:
SATO INTERNATIONAL PATENT FIRM (Fourteen Hills Center Building, 6-15 Sakae 4-chome, Naka-ku, Nagoya-sh, Aichi 08, 〒4600008, JP)
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