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Title:
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, CONTROL METHOD THEREFOR AND INFORMATION PROCESSING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2012/014303
Kind Code:
A1
Abstract:
When a scan storage element group in which a plurality of scan storage elements are connected in series is scanned to collect data, the determination as to whether the collected data is correct or erroneous can easily be performed. There are included a scan storage element group (6) in which a plurality of stages of scan storage elements are connected in series; an end code register (82) which is disposed between an input terminal and the input side of the scan storage element group (6) and which holds an end code; and a start code register (80) which is disposed between an output terminal and the output side of the scan storage element group (6) and which holds a start code. The scan storage element group (6), end code register (82) and start code register (80) are caused to perform shift operations, thereby outputting scan data at the output terminal.

Inventors:
IWAMI Yoshikazu (1-1 Kamikodanaka 4-chome, Nakahara-ku, Kawasaki-sh, Kanagawa 88, 〒2118588, JP)
岩見義和 (〒88 神奈川県川崎市中原区上小田中4丁目1番1号 富士通株式会社内 Kanagawa, 〒2118588, JP)
Application Number:
JP2010/062786
Publication Date:
February 02, 2012
Filing Date:
July 29, 2010
Export Citation:
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Assignee:
FUJITSU LIMITED (1-1 Kamikodanaka 4-chome, Nakahara-ku Kawasaki-sh, Kanagawa 88, 〒2118588, JP)
富士通株式会社 (〒88 神奈川県川崎市中原区上小田中4丁目1番1号 Kanagawa, 〒2118588, JP)
IWAMI Yoshikazu (1-1 Kamikodanaka 4-chome, Nakahara-ku, Kawasaki-sh, Kanagawa 88, 〒2118588, JP)
International Classes:
G01R31/28
Attorney, Agent or Firm:
HAYASHI Tsunenori et al. (Hayashi, Doi & Associates Toshou-Bldg. No.3, 3-9-5, Shin-yokohama, Kohoku-ku, Yokohama-sh, Kanagawa 33, 〒2220033, JP)
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Claims: