Title:
SEMICONDUCTOR LASER LIGHT SOURCE DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/135366
Kind Code:
A1
Abstract:
A technique in PIV is provided which makes it possible to suppress reduction in accuracy of measurement results due to shadows of tracer particles. This semiconductor laser light source device is provided with a light source unit which includes multiple emitters arranged in a first direction, and a lens which converts the lasers emitted from the emitters so as to be parallel in a second direction. For each of the multiple emitters, the lens includes multiple lens regions which convert the lasers emitted from the respective emitters so as to be parallel in the second direction. In at least two of the multiple emitters and two lens regions corresponding to the two emitters, the positions in the second direction of the lens regions corresponding to the emitters are different with reference to the positions in the second direction of the respective emitters.
Inventors:
YOSHINO MASAYA (JP)
Application Number:
PCT/JP2017/003749
Publication Date:
August 10, 2017
Filing Date:
February 02, 2017
Export Citation:
Assignee:
USHIO ELECTRIC INC (JP)
International Classes:
G01P5/20; H01S5/0239
Foreign References:
| JP2007102121A | 2007-04-19 | |||
| JP2005140528A | 2005-06-02 | |||
| JP2016004007A | 2016-01-12 | |||
| JP2015125013A | 2015-07-06 |
Attorney, Agent or Firm:
UNIUS PATENT ATTORNEYS OFFICE (JP)
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