SEMICONDUCTOR OPTICAL INTEGRATED DEVICE

WIPO Patent Application WO/2019/159345

A1

The purpose of the present invention is to provide a semiconductor optical integrated device which can monitor optical intensity without affecting the optical distribution of light propagating through an optical waveguide, and without deteriorating the properties of an optical element on the incident side. This semiconductor optical integrated device (200) is a semiconductor optical integrated device through which light propagates and in which a first optical element (61), a monitoring optical waveguide (62), and a second optical element (63) are formed on the same semiconductor substrate (1), wherein the monitoring optical waveguide (62) is connected to the first optical element (61), and the second optical element (63) is connected to the monitoring optical waveguide (62). The optical waveguide (62) is provided with a light scattering unit (7) in which optical waveguides having different mode field diameters are combined and which scatters a portion of the light. A light detection unit (65) for receiving the scattered light scattered by the light scattering unit (7) is installed on the outer circumference of the monitoring optical waveguide (62) or on the back surface that is on the reverse side of the semiconductor substrate (1) from the light scattering unit (7).

NAKAMURA NAOKI (JP)
ISHIMURA EITARO (JP)

PCT/JP2018/005636

August 22, 2019

February 19, 2018

Click for automatic bibliography generation  

MITSUBISHI ELECTRIC CORP (JP)

G02B6/122; G02B6/12; H01S5/026

JP2011165712A	2011-08-25
JP2009014681A	2009-01-22
JP2015518280A	2015-06-25
JP2002107559A	2002-04-10
US6453105B1	2002-09-17

OIWA Masuo et al. (JP)

View/Download PDF      PDF Help

Previous Patent: DRIVING ASSISTANCE DEVICE AND VIDEO DISPLAY METHOD

Next Patent: THYRISTOR STARTING DEVICE