Title:
SEMICONDUCTOR STORAGE DEVICE AND SEMICONDUCTOR STORAGE DEVICE TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2008/029434
Kind Code:
A1
Abstract:
A semiconductor storage device includes: memory blocks (M39, M38, … M1, M0) used when judgment is made for use in a first case; a memory block (MR) used as an alternative of the memory blocks (M39, M38, … M1, M0) when judgment is made for use in a second case; a write unit for writing judgment data into the memory blocks (M39, M38, … M1, M0) for making a judgment upon judgment and writing the judgment data into the memory block (MR); and a read unit for reading the judgment data written into the memory blocks (M39, M38, … M1, M0) by the write unit for making a judgment upon judgment and reading the judgment data written into the memory block (MR) by the write unit.
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Inventors:
KAMBARA, Fumi (1-1 Kamikodanaka 4-chome, Nakahara-ku, Kawasaki-sh, Kanagawa 88, 2118588, JP)
Application Number:
JP2006/317421
Publication Date:
March 13, 2008
Filing Date:
September 04, 2006
Export Citation:
Assignee:
FUJITSU LIMITED (1-1 Kamikodanaka 4-chome, Nakahara-ku Kawasaki-sh, Kanagawa 88, 2118588, JP)
富士通株式会社 (〒88 神奈川県川崎市中原区上小田中４丁目１番１号 Kanagawa, 2118588, JP)
富士通株式会社 (〒88 神奈川県川崎市中原区上小田中４丁目１番１号 Kanagawa, 2118588, JP)
International Classes:
G11C29/04
Attorney, Agent or Firm:
AKAZAWA, Hideo (Nakano KI Bldg. 4F, 5-1 Nakano 4-chome, Nakano-ku, Tokyo 01, 1640001, JP)
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