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Patent Searching and Data


Title:
SENSITIVITY CORRECTION METHOD AND IMAGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2008/023806
Kind Code:
A1
Abstract:
It is possible to provide a sensitivity correction method and an imaging device which can perform an accurate shading correction with a simple configuration. The imaging device includes a plurality of imaging elements (3), each including: a photo sensor (15) which photoelectrically converts an incident light; a charge accumulation unit (18) which transfers the charge accumulated in the photo sensor (15) so as to temporarily accumulate it; and a charge correction unit (20) which estimates charge leaking into the charge accumulation unit (18). According to the sensitivity correction method, light from an object is received by a plurality of imaging elements (3) and charge is accumulated. Then, the charge accumulated in the photo sensor (15) is transferred to the charge accumulation unit (18). A first charge quantity p1 accumulated is corrected by a second charge quantity p2 which has leaked to the charge correction unit (20) so as to obtain a third charge p3 which is made to be a charge quantity of each imaging element (3). Charge quantities are successively outputted for the plurality of imaging elements (3) so as to remove shading.

Inventors:
NAKATA TAKATOSHI (JP)
Application Number:
PCT/JP2007/066492
Publication Date:
February 28, 2008
Filing Date:
August 24, 2007
Export Citation:
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Assignee:
KYOCERA CORP (JP)
NAKATA TAKATOSHI (JP)
International Classes:
G06T1/00; H01L27/146; H04N1/028; H04N5/235; H04N5/359; H04N5/3745; H04N5/378
Foreign References:
JP2006197383A2006-07-27
JP2006217548A2006-08-17
JP2006217410A2006-08-17
JP2000023044A2000-01-21
JPH08205034A1996-08-09
JP2005328420A2005-11-24
JP2005175682A2005-06-30
JPH1097617A1998-04-14
JPH1169154A1999-03-09
JP2000358142A2000-12-26
JP2005080062A2005-03-24
JP2005269339A2005-09-29
Other References:
See also references of EP 2061235A4
Attorney, Agent or Firm:
SAIKYO, Keiichiro (2-6 Bingomachi 3-chome, Chuo-ku, Osaka-sh, Osaka 51, JP)
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