Title:
SENSOR DEVICE AND MEASUREMENT APPARATUS
Document Type and Number:
WIPO Patent Application WO/2019/073774
Kind Code:
A1
Abstract:
[Problem] The present invention addresses the problem of providing: a sensor device capable of suitably controlling the temperature of a sensing region for measuring potential; and a measurement apparatus. [Solution] This sensor device is provided with: an electrode array exposed in a sensing region; one or more wiring layers that are provided in a same layer in which the electrode array is provided; a temperature determining unit that determines the temperature of the sensing region on the basis of electrical resistance of the wiring layers; and a temperature control unit that controls the temperature of the sensing region on the basis of the sensing region temperature that has been determined by means of the temperature determining unit.
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Inventors:
JINGU MOTOKO (JP)
Application Number:
PCT/JP2018/034843
Publication Date:
April 18, 2019
Filing Date:
September 20, 2018
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
C12M1/34; G01N27/416
Domestic Patent References:
| WO2017122338A1 | 2017-07-20 | |||
| WO2005001018A1 | 2005-01-06 |
Foreign References:
| JP2015059929A | 2015-03-30 | |||
| JP2016041074A | 2016-03-31 | |||
| JP2009287934A | 2009-12-10 | |||
| JP2009529909A | 2009-08-27 | |||
| JP2004333485A | 2004-11-25 |
Attorney, Agent or Firm:
KAMEYA, Yoshiaki et al. (JP)
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