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Title:
SENSOR DIAGNOSIS DEVICE, SENSOR DIAGNOSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2018/055808
Kind Code:
A1
Abstract:
A sensor diagnosis device according to an embodiment has a simulation model generation unit, a sensor error setting unit, and a loss index calculation unit. The simulation model generation unit generates a simulation model of a facility including an object to be measured and a sensor for measuring the state of the object to be measured. The sensor error setting unit sets an error generated in a measurement value of the sensor with respect to the sensor in the simulation model. The loss index calculation unit performs simulation with the use of the simulation model for which the error is set, thereby calculating an index value corresponding to at least one of an energy loss amount of the facility and an economic loss amount thereof.

Inventors:
IINO Yutaka (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
TAMARU Shingo (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
KIMURA Koji (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
NOSAKA Takao (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
MORIYAMA Takuro (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
AISU Hideyuki (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
FUJIKAWA Tsutomu (1-1 Shibaura 1-chome, Minato-k, Tokyo 01, 〒1058001, JP)
Application Number:
JP2017/010627
Publication Date:
March 29, 2018
Filing Date:
March 16, 2017
Export Citation:
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Assignee:
KABUSHIKI KAISHA TOSHIBA (1-1 Shibaura 1-chome, Minato-ku Tokyo, 01, 〒1058001, JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORPORATION (72-34, Horikawa-cho Saiwai-ku, Kawasaki-sh, Kanagawa 85, 〒2128585, JP)
International Classes:
G05B23/02
Foreign References:
JP2013176224A2013-09-05
JPS5413883A1979-02-01
CA2835505A12015-05-27
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (1-9-2, Marunouchi Chiyoda-k, Tokyo 20, 〒1006620, JP)
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