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Patent Searching and Data


Title:
SERVICE PARAMETER ACQUISITION METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2017/133615
Kind Code:
A1
Abstract:
Disclosed are a service parameter acquisition method and apparatus. First, feature data of a sample user whose service parameter is to be predicted is acquired; the feature data is input into a logistic regression analysis model to obtain a feature parameter of the feature data, wherein the feature parameter is used for determining the service parameter. It is determined that the sample user has a first service parameter if the feature parameter is within a predetermined first threshold interval, and it is determined that the sample user has a second service parameter if the feature parameter is within a predetermined second threshold interval, wherein the logistic regression analysis model is obtained by performing logistic regression analysis and repeated iterative training using a large amount of feature data of the sample user. Because a great number of sample users are analyzed in advance by using a logistic regression analysis model to determine values corresponding to feature parameters, the service parameters acquired from a user whose service parameter is to be tested are relatively accurate, and relatively objective prediction of default of the sample user can be implemented.

Inventors:
HUANG WEN (CN)
Application Number:
PCT/CN2017/072593
Publication Date:
August 10, 2017
Filing Date:
January 25, 2017
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Assignee:
TENCENT TECH SHENZHEN CO LTD (CN)
International Classes:
H04L12/24
Foreign References:
CN101493913A2009-07-29
US20120022945A12012-01-26
Attorney, Agent or Firm:
SHENPAT INTELLECTUAL PROPERTY AGENCY (CN)
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