SHAPE INSPECTION METHOD, SHAPE INSPECTION DEVICE, AND PROGRAM

WIPO Patent Application WO/2016/182055

A1

[Problem] To provide a shape inspection method, shape inspection device, and program whereby the brightness and thickness of a light-section line in a light-section image can be more conveniently and objectively adjusted. [Solution] The shape inspection method pertaining to the present invention includes: a light-section image generation step for radiating linear laser light from a laser light source to an object surface, capturing an image of a light-section line of the laser light on the object surface through use of an imaging device, and generating a light-section image used in a light-section method; an index value calculation step for calculating each of a thickness index value indicating the thickness of the light-section line and a brightness index value indicating the brightness of the light-section line in the light-section image; a setting change step for changing a setting of at least one of the laser light source and the imaging device so that each of the thickness index value and the brightness index value is included in a predetermined range uniquely established in advance; and a shape inspection step for performing image processing of the light-section image subsequent to each of the thickness index value and the brightness index value having become included in the predetermined range, and inspecting the shape of the object surface.

HIBI ATSUHIRO (JP)
KONNO YUSUKE (JP)
FURUYA NOBUHIRO (JP)
KUROIWA TOMOHIRO (JP)

PCT/JP2016/064266

November 17, 2016

May 13, 2016

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NIPPON STEEL & SUMITOMO METAL CORP (JP)

G01B11/24

JPS6478109A	1989-03-23
JPH08327338A	1996-12-13
JP2013213733A	2013-10-17
JPH11125508A	1999-05-11

See also references of EP 3270102A4

KAMEYA, Yoshiaki et al. (JP)
Yoshiaki Kameya (JP)

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