SHAPE MEASURING METHOD

WIPO Patent Application WO/2012/164987

A1

A shape measuring method comprises: a step for creating a surface (C) representing the surface shape of an object to be measured as an implicit function on the basis of measurement point group data; a step for dividing the entire measurement region in which the surface (C) is present into tetrahedral small regions (hereinafter referred to as cells) laid closely without overlapping by division processing using a three-dimensional Delaunay drawing; a step for classifying the vertexes (4) of the cells into inner points (5) present inside the surface (C) and outer points (6) present outside; a step for extracting boundary cells; a step for calculating intersection points (7) of the boundary cells and the surface (C); a step for finding triangular or quadrangular faces (8) by connecting the intersection points (7) of the boundary cells; and a step for bonding all the faces (8). Consequently, closed polyhedral data that is the manifold of the object to be measured and contains no self-intersections can be automatically created.

KIRYU HIDETAKE (JP)
KURA KENJI (JP)
YAMAMOTO HIDEAKI (JP)
OISHI HIROSHI (JP)
YAMASAKI KENJIRO (JP)

PCT/JP2012/054511

December 06, 2012

February 24, 2012

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MITSUBISHI HEAVY IND LTD (JP)
KIRYU HIDETAKE (JP)
KURA KENJI (JP)
YAMAMOTO HIDEAKI (JP)
OISHI HIROSHI (JP)
YAMASAKI KENJIRO (JP)

G01B21/00; G01B21/20; G06T17/20

JPH08293042A	1996-11-05
JP2003345840A	2003-12-05
JPH03240170A	1991-10-25
JPH07152928A	1995-06-16
JP2007523402A	2007-08-16

MITSUISHI Toshiro et al. (JP)
Toshiro Mitsuishi (JP)

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