Title:
SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2014/155983
Kind Code:
A1
Abstract:
A signal detection circuit (1) is provided with: a VCO (23) which generates a reference signal; a complex signal generation circuit which generates a complex signal from an input signal and the reference signal; a vector operation circuit (27) which calculates the argument of the complex signal by a vector operation; and a subtraction-type phase comparator (28) which performs a phase comparison between the argument and the reference signal by a subtraction. The complex signal generation circuit comprises a multiplication circuit (24) which multiplies the input signal and the reference signal, and an HPF (26) which removes a direct-current component from a signal outputted from the multiplication circuit (24).
Inventors:
FUKUMA TAKESHI (JP)
MIYATA KAZUKI (JP)
MIYATA KAZUKI (JP)
Application Number:
PCT/JP2014/001198
Publication Date:
October 02, 2014
Filing Date:
March 04, 2014
Export Citation:
Assignee:
UNIV KANAZAWA NAT UNIV CORP (JP)
International Classes:
G01Q10/06; G01Q60/32
Domestic Patent References:
| WO2010023811A1 | 2010-03-04 | |||
| WO2010023811A1 | 2010-03-04 |
Foreign References:
| US20080295583A1 | 2008-12-04 | |||
| JP2010512518A | 2010-04-22 |
Other References:
See also references of EP 2980590A4
Attorney, Agent or Firm:
NII, Hiromori (JP)
New house Extensive 守 (JP)
New house Extensive 守 (JP)
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