Title:
SIGNAL LIGHT MEASUREMENT SYSTEM FOR NEAR-FIELD OPTICAL MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2010/032429
Kind Code:
A1
Abstract:
Disclosed is a signal light measurement system for a near-field optical microscope which is capable of investigating the dependency of signal light emitted from a specimen by means of near-field light with respect to the distance between a probe and the specimen. This signal light measurement system is equipped with a probe (14) which scans the surface of a specimen, a light source (16), and a spectroscope (18) which detects signal light emitted from the specimen. The probe (14) comprising a cantilever and a silver chip on the tip thereof. The cantilever is vibrated by an oscillator (20), causing the tip of the silver chip to intermittently make contact with the surface of the specimen. Light emitted from the light source (16) passes through a light modulator (24), a beam splitter (26), an objective lens (22), and a transparent substrate (12), and strikes the specimen surface, generating near-field light at the specimen surface. Signal light is radiated from the specimen by means of this near-field light.
More Like This:
Inventors:
ICHIMURA TARO (JP)
YANO TAKAAKI (JP)
INOUYE YASUSHI (JP)
KAWATA SATOSHI (JP)
YANO TAKAAKI (JP)
INOUYE YASUSHI (JP)
KAWATA SATOSHI (JP)
Application Number:
PCT/JP2009/004588
Publication Date:
March 25, 2010
Filing Date:
September 15, 2009
Export Citation:
Assignee:
JAPAN SCIENCE & TECH AGENCY (JP)
ICHIMURA TARO (JP)
YANO TAKAAKI (JP)
INOUYE YASUSHI (JP)
KAWATA SATOSHI (JP)
ICHIMURA TARO (JP)
YANO TAKAAKI (JP)
INOUYE YASUSHI (JP)
KAWATA SATOSHI (JP)
International Classes:
G01N13/14
Foreign References:
| JPH07260808A | 1995-10-13 | |||
| JP2002243618A | 2002-08-28 |
Other References:
TARO ICHIMURA ET AL.: "Tip Zokyo Kinsetsuba Raman Spectrum no Tip -Shiryokan Kyori Izonsei no Sokuteiho", DAI 54 KAI EXTENDED ABSTRACTS, JAPAN SOCIETY OF APPLIED PHYSICS AND RELATED SOCIETIES, vol. 3, 27 March 2007 (2007-03-27), pages 1092
TAKA-AKI YANO ET AL.: "Confinement of enhanced field investigated by tip-sample gap regulation in tapping-mode tip-enhanced Raman microscopy", APPLIED PHYSICS LETTERS, vol. 91, 17 September 2007 (2007-09-17), pages 121101-1 - 121101-3
TAKA-AKI YANO ET AL.: "Confinement of enhanced field investigated by tip-sample gap regulation in tapping-mode tip-enhanced Raman microscopy", APPLIED PHYSICS LETTERS, vol. 91, 17 September 2007 (2007-09-17), pages 121101-1 - 121101-3
Attorney, Agent or Firm:
Kyoto International Patent Law Office (JP)
Patent business corporation Kyoto international patent firm (JP)
Patent business corporation Kyoto international patent firm (JP)
Download PDF:
Previous Patent: HIGH-STRENGTH STEEL PLATE AND PROCESS FOR PRODUCING SAME
Next Patent: AIR CONDITIONING DEVICE
Next Patent: AIR CONDITIONING DEVICE