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Patent Searching and Data


Title:
SIGNAL PROCESSING DEVICE AND TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/064460
Kind Code:
A1
Abstract:
This signal processing device (10) comprises an A/D conversion unit (14), a test signal supply unit (12), a determination unit (15), and an output unit (16). The A/D conversion unit (14) converts an analog signal into a digital signal and outputs the digital signal. The test signal supply unit (12) supplies an analog test signal corresponding to a test bit pattern to the A/D conversion unit (14). When the level of the analog test signal supplied to the A/D conversion unit (14) has switched, the determination unit (15) determines whether test bit values of the digital signal that has been converted and output by the A/D conversion unit (14) differ from before and after the switching of the level of the analog test signal. The output unit (16) outputs the results of the determination by the determination unit (15).

Inventors:
KURACHI HARUYUKI (JP)
Application Number:
PCT/JP2017/035334
Publication Date:
April 04, 2019
Filing Date:
September 28, 2017
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R31/316
Foreign References:
JPH05199113A1993-08-06
JPH0856160A1996-02-27
JPH09162735A1997-06-20
JPH1096758A1998-04-14
JP2012120229A2012-06-21
JP2006303574A2006-11-02
JP2008076358A2008-04-03
JP2007006512A2007-01-11
JPH10256910A1998-09-25
JP2014160939A2014-09-04
JP2005303602A2005-10-27
JP2012191412A2012-10-04
Attorney, Agent or Firm:
KIMURA Mitsuru (JP)
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