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Patent Searching and Data


Title:
SIGNAL QUALITY ASSESSMENT DEVICE, METHOD FOR GENERATING SIGNAL QUALITY ASSESSMENT VALUE, AND REPRODUCTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/042814
Kind Code:
A1
Abstract:
The present invention makes it possible to obtain a highly accurate signal quality assessment value capable of having a high correlation with the error rate for a reproduction signal from a high-density recording medium. For this purpose, an estimated value of a path selection error rate is calculated on the basis of a maximum likelihood path at each time point that is a detection path for maximum likelihood decoding in a PRML decoding system and the distribution of path metric differences of a second path having the second highest likelihood. Further, the average number of error bits in error detection is calculated from the number of differences in bits between the maximum likelihood path when selecting a path at each time point in the maximum likelihood decoding and the second path. Then, an estimated bit error rate is calculated from these results, and an assessment value in accordance with the estimated bit error rate is generated.

Inventors:
SHIRAISHI, Junya (4-14-1 Asahi-cho Atsugi-sh, Kanagawa 14, 〒2430014, JP)
Application Number:
JP2017/021684
Publication Date:
March 08, 2018
Filing Date:
June 12, 2017
Export Citation:
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Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORPORATION (4-14-1 Asahi-cho, Atsugi-shi Kanagawa, 14, 〒2430014, JP)
International Classes:
G11B20/18; G11B20/10; H03M13/41
Domestic Patent References:
WO2013183385A12013-12-12
Foreign References:
JP2007018622A2007-01-25
JP2006286073A2006-10-19
JP2008293577A2008-12-04
JP2008305457A2008-12-18
JP2010262702A2010-11-18
JP2009129494A2009-06-11
Attorney, Agent or Firm:
IWATA, Masanobu et al. (Technopeer Patents & Trademarks, Hakusei Bldg. 8th Floor 1-3-9, Iwamoto-cho, Chiyoda-k, Tokyo 32, 〒1010032, JP)
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