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Title:
SINGLE PHOTON DETECTOR IN THE NEAR INFRARED USING AN INGAAS/INP AVALANCHE PHOTODIODE OPERATED WITH A BIPOLAR RECTANGULAR GATING SIGNAL.
Document Type and Number:
WIPO Patent Application WO/2013/002430
Kind Code:
A1
Abstract:
The present invention relates to a single photon detector (SPD) at telecom wavelength of 1.55 μm based on InGaAs/InP avalanche photodiode (APD). In order to operate the SPD at a low after-pulse noise, a DC bias voltage lower than the breakdown voltage is applied to an InGaAs/InP APD. A bipolar rectangular gating signal is superimposed with the DC bias voltage and applied to the APD so as to exceed the breakdown voltage during the gate-on time of each period of the gate signal. The use of the bipolar rectangular gating signal enabling us to operate the APD well below the breakdown voltage during the gate-off time, thereby make the release of the trapped charge carriers faster and then reduces the after-pulse noise. As a result, it permits to increase the repetition rate of the SPD.

Inventors:
BOUZID ABDESSATTAR (KR)
MOON SUNG WOOK (KR)
YI DONG HOON (KR)
KIM SE MIN (KR)
Application Number:
PCT/KR2011/004696
Publication Date:
January 03, 2013
Filing Date:
June 28, 2011
Export Citation:
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Assignee:
KOREA INST SCI & TECH (KR)
BOUZID ABDESSATTAR (KR)
MOON SUNG WOOK (KR)
YI DONG HOON (KR)
KIM SE MIN (KR)
International Classes:
G01J3/443
Domestic Patent References:
WO2009115956A22009-09-24
Foreign References:
US20090039237A12009-02-12
US20090072876A12009-03-19
US20050061986A12005-03-24
US20090008564A12009-01-08
Attorney, Agent or Firm:
KIM, Sun-Young (10th Floor 80-6,Susong-Dong, Chongro-Ku, Seoul 110-727, KR)
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Claims: