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Title:
SIX-DEGREES-OF-FREEDOM DISPLACEMENT MEASUREMENT METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/236298
Kind Code:
A1
Abstract:
A six-degrees-of-freedom displacement (Lx, Ly, Lz, Rx, Ry, Rz) measurement method and apparatus. The method comprises: on the basis of a three-dimensional digital speckle interference technique, measuring three phase images, which are caused by a geometric motion and/or the deformation of a measured object; and on the basis of the three phase images, determining six-degrees-of-freedom displacements (Lx, Ly, Lz, Rx, Ry, Rz) of the measured object, wherein the six-degrees-of-freedom displacements (Lx, Ly, Lz, Rx, Ry, Rz) comprise: three linear displacements (Lx, Ly, Lz) and three angular displacements (Rx, Ry, Rz). By means of the measurement method and apparatus, target-lens-free measurement of a measured object can be effectively implemented, and the precision of six-degrees-of-freedom displacements (Lx, Ly, Lz, Rx, Ry, Rz) which are obtained by means of measurement is high.

Inventors:
WU SIJIN (CN)
SHI LILI (CN)
DONG MINGLI (CN)
LI WEIXIAN (CN)
Application Number:
PCT/CN2022/103733
Publication Date:
December 14, 2023
Filing Date:
July 04, 2022
Export Citation:
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Assignee:
BEIJING INFORMATION SCIENCE AND TECHNOLOGY UNIV (CN)
International Classes:
G01B11/02; G01B11/16; G01B11/26
Foreign References:
CN103148798A2013-06-12
CN105973169A2016-09-28
CN110006367A2019-07-12
CN102589448A2012-07-18
CN108106556A2018-06-01
CN105093893A2015-11-25
US20180328713A12018-11-15
Other References:
TENGFEI YUAN, WU SIJIN; LI WEIXIAN: "Endoscopic measurement of in-plane deformation using all-fiber digital speckle pattern interferometry ", JOURNAL OF BEIJING INFORMATION SCIENCE & TECHNOLOGY UNIVERSITY, BEIJING INFORMATION SCIENCE & TECHNOLOGY UNIVERSITY, CN, vol. 35, no. 5, 15 October 2020 (2020-10-15), CN , pages 35 - 42, XP093114525, ISSN: 1674-6864, DOI: 10.16508/j.cnki.11-5866/n.2020.05.008
Attorney, Agent or Firm:
LINDA LIU & PARTNERS (CN)
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