Title:
SKIN EVALUATION DEVICE, SKIN EVALUATION METHOD, AND SKIN EVALUATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2017/056980
Kind Code:
A1
Abstract:
The present invention easily and accurately evaluates the state of a cosmetic applied to the skin. A principal component analysis unit 4 performs principal component analysis on spectral reflectance measurements obtained from a spectral image and calculates the eigenvectors of the first to third principal components and the principal component scores of the first to third principal components on the basis of the eigenvectors of the first to third principal components. A skin evaluation unit 5 evaluates the state of a cosmetic applied to the skin using at least one of the calculated principal component scores of the first to third principal components, and threshold values previously set for the principal components or a discriminant function.
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Inventors:
YOSHIDA NAOKO (JP)
Application Number:
PCT/JP2016/077037
Publication Date:
April 06, 2017
Filing Date:
September 14, 2016
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
A45D44/00; G01N21/27; G06T1/00
Foreign References:
JP5650012B2 | 2015-01-07 | |||
JP2014093043A | 2014-05-19 | |||
JP2015005281A | 2015-01-08 |
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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