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Patent Searching and Data


Title:
SLURRY COMPOSITION FOR POLISHING SILICON OXIDE FILM, AND POLISHING METHOD USING SAME
Document Type and Number:
WIPO Patent Application WO/2020/180061
Kind Code:
A1
Abstract:
The invention of the present application relates to a slurry composition for CMP, and a polishing method using same and, more specifically, provides a slurry composition for CMP, and a polishing method using same, which are capable of minimizing scratches and increasing polishing performance for a silicon oxide film by removing metal foreign matters and the zeta potential of colloidal silica that is a polishing material, and which are capable of polishing by freely adjusting a selection ratio with respect to the silicon oxide film, a silicon nitride film, and a polysilicon film by adjusting the additive content and the polishing material content, and which can thereby be usefully applied to a semiconductor process for removing unevenness in the silicon oxide film and to a semiconductor manufacturing process requiring selective removal of the silicon oxide film and the polysilicon film with respect to the silicon nitride film.

Inventors:
LEE SEUNG HUN (KR)
LEE SEUNG HYUN (KR)
KIM SEONG HWAN (KR)
Application Number:
PCT/KR2020/002934
Publication Date:
September 10, 2020
Filing Date:
March 02, 2020
Export Citation:
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Assignee:
YOUNG CHANG CHEMICAL CO LTD (KR)
International Classes:
C09G1/02; C09K3/14; H01L21/3105
Domestic Patent References:
WO2009032096A12009-03-12
Foreign References:
KR101628878B12016-06-16
JP2013074036A2013-04-22
KR20120067701A2012-06-26
KR101409889B12014-06-19
Other References:
See also references of EP 3936582A4
Attorney, Agent or Firm:
HAEDAM IP GROUP (KR)
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