Title:
SOCKET APPARATUS FOR SEMICONDUCTOR DEVICE TEST
Document Type and Number:
WIPO Patent Application WO/2015/167178
Kind Code:
A1
Abstract:
The present invention relates to a socket apparatus for a semiconductor device test, comprising: body elements (100) (200) into which a contact (400) is fixedly inserted; movable elements (300) (500) on which a semiconductor device (IC) is seated such that a terminal of the semiconductor device makes contact with the upper end of the contact and which is resiliently supported by the body elements (100) (200) so as to be movable up and down within a preset height range; a socket cover (600) assembled to the upper portions of the movable elements (300) (500) and assembled to the body elements (100) (200) so as to be resilient in an up and down direction; and a semiconductor device pressing part (700) that presses and fixes the semiconductor device (IC), which is seated on the movable elements (300) (500), in conjunction with the top and bottom locations of the cover element (600), wherein the semiconductor device pressing part (700) includes: a pusher plate (710) that includes an opening cam (711) positioned on the lower end of an inner wall structure of the socket cover (600) to contact the socket cover when the socket cover (600) moves downward, and makes surface-to-surface contact with the upper surface of the semiconductor device (IC) to press the upper surface thereof; a latch (720) that is hingedly assembled, at one end thereof, to the cover element (600) and is hingedly assembled, at an opposite end thereof, to the pusher plate (710); and a link (730) that is hingedly assembled, at one end thereof, to the body elements (100) (200) and is hingedly assembled, at an opposite end thereof, to the latch (720).
Inventors:
HWANG DONG WEON (KR)
HWANG JAE SUK (US)
HWANG JAE BAEK (KR)
HWANG JAE SUK (US)
HWANG JAE BAEK (KR)
Application Number:
PCT/KR2015/004141
Publication Date:
November 05, 2015
Filing Date:
April 27, 2015
Export Citation:
Assignee:
HWANG DONG WEON (KR)
HICON CO LTD (KR)
HWANG JAE SUK (US)
HWANG JAE BAEK (KR)
HICON CO LTD (KR)
HWANG JAE SUK (US)
HWANG JAE BAEK (KR)
International Classes:
G01R1/073; G01R31/26
Foreign References:
| KR20120054548A | 2012-05-30 | |||
| KR20030022736A | 2003-03-17 | |||
| KR20030051371A | 2003-06-25 | |||
| KR200425576Y1 | 2006-09-06 |
Attorney, Agent or Firm:
LEE, UN CHEOL (KR)
이은철 (KR)
이은철 (KR)
Download PDF: