Title:
SOLAR CELL REFURBISHMENT METHOD, SOLAR CELL MANUFACTURING METHOD, SOLAR CELL MANUFACTURED BY SAID MANUFACTURING METHOD, SOLAR CELL REFURBISHMENT DEVICE, SOLAR CELL MANUFACTURING DEVICE AND INSPECTION DEVICE, AND SOLAR CELL MANUFACTURED BY A PROCESS USING SAID DEVICES
Document Type and Number:
WIPO Patent Application WO/2011/104881
Kind Code:
A1
Abstract:
Provided are: a solar cell refurbishment method that can efficiently remove a shorted part from a solar cell; a method for manufacturing solar cells suited to said refurbishment method; a solar cell manufactured by said manufacturing method; a solar cell refurbishment device; a solar cell manufacturing device and inspection device, and a solar cell manufactured by a process using said devices. First, the resistance per unit length of a solar cell (105) in a thin-film solar cell module (100) is inputted as a parameter. A probe unit (305) is used to apply a reverse voltage to the solar cell (105) via point probe pins (305a and 305b). The position on the solar cell (105) to which to move the probe unit (305) is computed, the probe unit (305) is moved to said position, the probe pins (305a and 305b) are put in contact with the solar cell (105), a reverse voltage is applied, and the resulting leakage current is detected. When said leakage current falls to or below an allowable leakage current, the shorted part removal process is ended.
Inventors:
AIZONO TAKEIKI (JP)
OKAJIMA HIDEKI (JP)
OKAJIMA HIDEKI (JP)
Application Number:
PCT/JP2010/053155
Publication Date:
September 01, 2011
Filing Date:
February 26, 2010
Export Citation:
Assignee:
NF CORP (JP)
AIZONO TAKEIKI (JP)
OKAJIMA HIDEKI (JP)
AIZONO TAKEIKI (JP)
OKAJIMA HIDEKI (JP)
International Classes:
H01L31/04
Domestic Patent References:
| WO2009020073A1 | 2009-02-12 |
Foreign References:
| JP3740618B2 | 2006-02-01 | |||
| JP3143616B2 | 2001-03-07 |
Attorney, Agent or Firm:
SUZUYE, Takehiko et al. (JP)
Takehiko Suzue (JP)
Takehiko Suzue (JP)
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Claims: