SOLID-STATE IMAGING DEVICE AND DISTANCE MEASUREMENT DEVICE

Title:

SOLID-STATE IMAGING DEVICE AND DISTANCE MEASUREMENT DEVICE

Document Type and Number:

WIPO Patent Application WO/2020/241151

Kind Code:

A1

Abstract:

According to the present invention, distance measurement accuracy is improved. A solid-state imaging device according to an embodiment comprises a pixel array part (101) in which a plurality of pixels (20-1) are arranged in a matrix, wherein each of the pixels includes: a plurality of photoelectric conversion units (211, 212) that photoelectrically convert incident light to generate electric charges; a floating diffusion region (27) in which the electric charges are accumulated; a plurality of transfer circuits (23, 24, 25) that transfer, to the floating diffusion region, the electric charges generated in each of the plurality of photoelectric conversion units; and a first transistor that causes a pixel signal having a voltage value according to the charge amount of the electric charges accumulated in the floating diffusion region to appear in a signal line.

Inventors:

YOKOGAWA SOZO (JP)
MORIYAMA YUSUKE (JP)
KAWAI NOBUHIRO (JP)
YORIKADO YUHI (JP)
KOGA FUMIHIKO (JP)
EBIKO YOSHIKI (JP)
ENDO SUZUNORI (JP)
WAKABAYASHI HAYATO (JP)

Application Number:

PCT/JP2020/017964

Publication Date:

December 03, 2020

Filing Date:

April 27, 2020

Export Citation:

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Assignee:

SONY SEMICONDUCTOR SOLUTIONS CORP (JP)

International Classes:

H04N5/3745; G01C3/06; H01L27/146; H04N5/369

Domestic Patent References:

WO2017056347A1

2017-04-06

Foreign References:

JP2019004149A	2019-01-10
JP2019029906A	2019-02-21
JP2009008537A	2009-01-15
JP2017201760A	2017-11-09
JP2019004149A	2019-01-10

Other References: