Title:
SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND CONTROL METHOD FOR SOLID-STATE IMAGING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2019/187685
Kind Code:
A1
Abstract:
A solid-state imaging element that detects address events and easily identifies defective pixels. According to the present invention, for each of a plurality of pixels, an address event detection part detects, as an address event, whether the absolute value of the change in the brightness of the pixel has exceeded a prescribed threshold value and outputs a detection signal that indicates the detection results. For each of the plurality of pixels, a detection frequency acquisition part acquires a detection frequency for address events. On the basis of statistics for the detection frequencies, a defective pixel identification part identifies defective pixels from among the plurality of pixels, the defective pixels being pixels at which an abnormality has occurred.
Inventors:
NIWA ATSUMI (JP)
Application Number:
PCT/JP2019/004390
Publication Date:
October 03, 2019
Filing Date:
February 07, 2019
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/367; H04N5/225
Domestic Patent References:
| WO2017086181A1 | 2017-05-26 |
Foreign References:
| JP2010087668A | 2010-04-15 | |||
| JP2012523025A | 2012-09-27 | |||
| JP2016533140A | 2014-11-14 |
Other References:
LICHTSTEINER, PATRICK ET AL.: "A 128X128 120dB 15ยต s Latency Asynchronous Temporal Contrast Vision Sensor", IEEE JOURNAL OF SOLID-STATE CIRCUITS, vol. 43, no. 2, 31 January 2008 (2008-01-31), pages 566 - 576, XP011200748, doi:10.1109/JSSC.2007.914337
See also references of EP 3780579A4
See also references of EP 3780579A4
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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