Title:
SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND SOLID-STATE IMAGING ELEMENT CONTROL METHOD
Document Type and Number:
WIPO Patent Application WO/2019/239722
Kind Code:
A1
Abstract:
In order to improve the quality of image data in a solid-state imaging element that detects an address event, this solid-state imaging element is provided with a photodiode, a pixel signal generating unit and a detection unit. In the solid-state imaging element, the photodiode generates electrons and holes by photoelectric conversion. The pixel signal generating unit generates a pixel signal of a voltage corresponding to the amount of one of the electrons and the holes. The detection unit detects whether or not the change in the amount of the other of the electrons and the holes has exceeded a prescribed threshold value and outputs a detection signal.
Inventors:
KITANO SHIN (JP)
Application Number:
PCT/JP2019/016989
Publication Date:
December 19, 2019
Filing Date:
April 22, 2019
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/335; H04N5/369; H04N5/3745
Domestic Patent References:
| WO2017013806A1 | 2017-01-26 | |||
| WO2015159728A1 | 2015-10-22 |
Foreign References:
| JP2004282679A | 2004-10-07 | |||
| JP2016501495A | 2016-01-18 | |||
| JPS6472667A | 1989-03-17 |
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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