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Title:
SOLID-STATE IMAGING ELEMENT, IMAGING DEVICE, AND METHOD FOR CONTROLLING SOLID-STATE IMAGING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2020/100399
Kind Code:
A1
Abstract:
A solid-state imaging element that corrects a black spot, wherein the accuracy of correction is improved.　The solid-state imaging element comprises an assessment unit and a correction unit. In the solid-state imaging element, the assessment unit assesses whether both of a reset level generated by initialization of a pixel of interest that is focused on from among a plurality of pixels and a reset level generated by initialization of an adjacent pixel that is adjacent to the pixel of interest exceed a prescribed threshold value. The correction unit corrects a pixel signal generated by the pixel of interest when the reset levels of both of the pixel of interest and the adjacent pixel exceed the threshold value.

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Inventors:
HOSOE TAKASHI (JP)
Application Number:
PCT/JP2019/035833
Publication Date:
May 22, 2020
Filing Date:
September 12, 2019
Export Citation:
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Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/359; H04N5/363
Domestic Patent References:
WO2014065223A12014-05-01
Foreign References:
JP2008283557A2008-11-20
JP2009290296A2009-12-10
JP2005341463A2005-12-08
JP2009253535A2009-10-29
Attorney, Agent or Firm:
MARUSHIMA, Toshikazu (JP)
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